Materials Analysis and Spectroscopy Facility

Located primarily on the 6th floor of the Engineering Education and Research Building (EER), the MAS facility provides state-of-the-art instrumentation for analyzing the surface composition of materials, the surface topology, and the crystallinity of materials. This includes multiple x-ray photoemission spectroscopy (XPS), time of flight secondary ion mass spectroscopy, various x-ray diffraction systems, atomic force microscopy, scanning electron microscopy, surface profilometers, and air-free sample preparation setups. On the 5th floor of EER, the materials property lab provides access absorption and fluorescence spectrometers, Raman spectroscopy, FTIR, DLS, and rheology measurements.

Photo of Materials Analysis and Spectroscopy Facility

Keyence VK-X1100 Optical Profilometer

Equipment Type:

Microscopy/Surface Analysis

Optical Profiles

Surface Analysis

Contact:
Location: EER 6.636

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Rigaku ULTIMA IV Diffractometer

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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Scintag X1 Theta-Theta Diffractometer

Equipment Type:

X-ray Diffraction

Contact:
Location: EER 6.640

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Rigaku Miniflex 600 Diffractometer

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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Rigaku Miniflex 600 Diffractometer II

Equipment Type:

X-ray Diffraction

X-ray Scattering

Contact:
Location: EER 6.640

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FEI Quanta 650 ESEM

Equipment Type:

Electron Microscopy

Scanning Electron Microscopes (SEM)

Contact:
Location: EER 6.628

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Nano/Microfiber Electrospinning System

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: EER 6.628

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Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD

Equipment Type:

Microscopy/Surface Analysis

Contact:
Location: EER 6.636

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Dynamic Light Scattering Zetasizer Nano ZS

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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Hitachi IM4000C Broad Beam Ion Milling System

Equipment Type:

Nano and Micro Fabrication

Contact:
Location: EER 6.636

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Infrared Spectrometer-Infinity Gold FTIR

Equipment Type:

Polymer Characterization

Spectroscopy

Contact:
Location: EER 6.640

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Mettler Thermogravimetric Analyzer, Model TGA/DSC 1

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.636

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SV-100 Viscometer

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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SAXSLabs Ganesha

Equipment Type:

SAXS

X-ray Scattering

Contact:
Location: EER 6.640

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Asylum MFP-3D AFM

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Contact:
Location: EER 6.628

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Park Systems NX10 AFM

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Location: EER 6.628

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Cary 5000 UV/Vis NIR

Equipment Type:

Spectroscopy

Contact:
Location: EER 6.636

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Fluorolog3 Fluorimeter

Equipment Type:

Spectroscopy

Contact:
Location: EER 6.636

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OptiLab Refractometer

Equipment Type:

Polymer Characterization

Contact:
Location: EER 6.640

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Witec Micro-Raman Spectrometer Alpha 300

Equipment Type:

Micro Raman Spectra

Spectroscopy

Contact:
Location: EER 6.628

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Extrel Max XT Mass Spectrometer

Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Contact:
Location: EER 6.636

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Mbraun Argon Glovebox I

Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Contact:
Location: EER 6.636

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Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5)

Equipment Type:

Microscopy/Surface Analysis

Contact:
Location: EER 6.636

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Hood for Handling Powder Materials

Equipment Type:

TEM Sample Preparation

Contact:
Location: EER 6.626

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Photo of Materials Analysis and Spectroscopy Facility

Mbraun Nitrogen Glovebox

Equipment Type:

Microscopy/Surface Analysis

TEM Sample Preparation

Contact:
Location: EER 6.626

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Hood for STM and TEM Sample Prep

Equipment Type:

Microscopy/Surface Analysis

TEM Sample Preparation

Contact:
Location: EER 0.746

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Scanning Tunneling Microscopes

Equipment Type:

Microscopy/Surface Analysis

Scanning Tunneling Microscopes (STM)

Surface Analysis

Contact:
Location: EER 0.746

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Photo of Materials Analysis and Spectroscopy Facility

Park Scientific CP and XE-100 AFMs

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Contact:
Location: EER 6.626

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