Located on the 6th floor of the Engineering Education and Research (EER) Building, the facility provides state-of-the-art instrumentation for comprehensive characterization of the surface composition, topology, structure, and crystallinity of materials. The facility houses multiple X-ray photoelectron spectroscopy (XPS) systems, time-of-flight secondary ion mass spectrometry (ToF-SIMS), several X-ray diffraction (XRD) systems, X-ray absorption and fluorescence spectroscopy, Raman spectroscopy, Fourier-transform infrared (FTIR) spectroscopy, dynamic light scattering (DLS), atomic force microscopy (AFM), surface profilometry, and air-free sample preparation systems. Together, these capabilities enable detailed chemical, structural, morphological, and surface analysis of a broad range of materials.