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Photo of X-ray Diffraction

Rigaku ULTIMA IV Diffractometer

Contact: Dr. Steve Swinnea
Email:
Location: EER 6.640

Equipment Type:

X-ray Diffraction

X-ray Scattering

Instrument Capabilities

The Rigaku ULTIMA IV Diffractometer is a multipurpose diffractometer equipped with patented cross-beam optics for rapid switching between measurement modes. The system is used for the identification of crystalline phases and characterization of crystal structure and crystallinity. The instrument supports specialized measurements, including elevated-temperature (non-ambient) studies, micro-area diffraction, and small-angle X-ray scattering (SAXS).

Key features:

  • High-temperature stage: Room temperature to approximately 1500°C
  • Controlled atmosphere: Measurements can be performed in air, controlled gas, or vacuum
  • X-ray source: 2.2 kW Cu Kα long-fine-focus tube
  • Focus size: 0.4 × 12 mm
  • Goniometer radius: 285 mm
  • Theta/Theta wide-angle goniometer: −3° to +154° in 2θ
  • Minimum angular step: 0.0001°
Illustration of focusing geometry Illustration of parallel beam geometry Rigaku reciprocal space mapping illustration Rigaku rocking curve graph
 

Fees and Policies

  • UT Users: $7/hour
  • Higher Education/State Agencies: $45/hour
  • Corporate/External Users: $45/hour

Training

Users should register for the required in-person training course through UTLearn .