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Park Systems NX10 AFM

Location: EER 6.628

Equipment Type:

Atomic Force Microscopes

Microscopy/Surface Analysis

Information the Equipment Can Provide

The NX10 Atomic Force Microscope (AFM) is equipped with a variety of imaging modes which include:

  • Standard modes:
    • Contact and LFM
    • Tapping mode
    • F/D Spectroscopy and Force Volume Imaging
    • Nanoindentaion
  • SPECIAL: true Non-Contact AFM
  • Magnetic Force Microscopy
  • Scanning Ion Conductance Microscopy (SICM): lateral resolution 80-100 nm
  • Electrical measurements: KPFM, PinPoint conductive AFM, I-V Spectroscopy, Electrostatic Force Microscopy
  • Imaging in liquids (contact mode) coming soon!


  • The system is equipped with an acoustic enclosure. However, the system is operated more commonly inside a glovebox where the oxygen and water are controlled/monitored.
    • Humidity control from 2 to 90%.
    • O2 level in the 100 ppm range (working gas Ar and N2).
  • Independent 2D flexure-guided XY scanner structure for the sample scanning and positioning, separated from the topography feedback mechanism of the Z scanner. The Flexure-guided XY scanner is used to maintain zero background curvature.
  • 100 μm by 100 μm scan area with closed looped position control
  • Z range of 15 μm
  • Sample size: up to 100 × 100 mm (less than 50 × 50 mm recommended), 20 mm thickness
  • Includes a magnetic sample holder
  • Motorized XY scanner with a travel range of 20 by 20 mm, step 0.6 microns
  • Motorized Z stage with a travel range of 22 mm, step 0.08 microns
  • Temperature controlled stage from ambient up to 250°C (sample size 18 by 18 mm)
  • Engaging on the sample is fully automatic
  • AFM sensors can be purchase pre-mounted with minimal laser alignment necessary.

Fees and Policies

  • UT Users: $17/hour
  • Higher Education/State Agencies: $40/hour
  • Corporate/External Users: $40/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.