Equipment Type:

Microscopy/Surface Analysis

Surface Analysis

Instrument Capabilities

The Kratos XPS system is a multi-technique surface analysis platform that combines photoelectron and ion spectroscopies with surface-mapping capabilities. It is primarily used to determine the elemental composition and chemical state of material surfaces, providing detailed information about surface chemistry and electronic structure.

Available Techniques:

• X-ray Photoelectron Spectroscopy (XPS): Provides information on the elemental composition, chemical states, and chemical bonding of materials.
• Ultraviolet Photoelectron Spectroscopy (UPS): Provides information on valence-band electronic structure and work function measurements.
• Low-Energy Ion Scattering Spectroscopy (ISS): Provides information on the elemental composition and near-surface structure of solid surfaces.

Key features

• Detected signal: Photoelectrons emitted from atoms within the near-surface region
• Elemental range: Elements from lithium (Li) to heavy metals
• Detection limits: Approximately 0.1–1 atomic %
• Depth resolution: Approximately 2–8 nm
• Depth profiling: Approximately 0.5 nm/s using an argon-ion beam
• Lateral resolution: Approximately 15–500 µm.

Fees and Policies

• UT Users: $20/hour
• Higher Education/State Agencies: $91/hour
• Corporate/External Users: $91/hour

Traning

Please contact Dr. Hugo Celio to schedule a training session.