Equipment Type:

Electron Microscopy

Transmission Electron Microscopy (TEM)

Instrument Capabilities

The JEOL NEOARM is a probe-corrected transmission electron microscope with aberration correction from 30 kV to 200 kV.

Key Features

• Atomic-level imaging at 30 kV, 80 kV and 200 kV in STEM
• Atomic-level elemental mapping (EDXS and EELS)
• Electric binding state and plasmon mapping (EELS)
• Energy filtered imaging
• In situ liquid cell, heating and biasing
• Auto tune for fast alignment

Specifications

• Imaging Modes: TEM/STEM
• Voltage: 30 kV to 200 kV
• STEM resolution: 0.0783 nm (200 kV)/ 0.1108 nm (80 kV)/ 0.1920 nm (30 kV)
• Energy resolution: sub 0.3 eV
• Point to Point Resolution TEM: 0.023 nm (200 kV)
• Source: Cold Field Emission
• Tilt Range: 80° (with high tilt holder)
• Lorentz lens

Attachments/Accessories

• Hybrid high angle annular dark field detector
• Annular bright field detector
• Gatan OneView Camera with IS video software (up to 300 fps)
• JEOL large angle silicon drift EDS detector (0.96 sr)
• Gatan Quantum energy filter with DualEELS
• Protochips Fusion Heating/Biasing Holder and Poseidon Liquid Cell
• High tilt holder
• Double-Tilt Holder

Fees and Policies

• UT Users: $130/hour
• Higher Education/State Agencies: $283/hour
• Corporate/External Users: $283/hour

Traning

Users should register for the required in-person training course through UTLearn.

TMI: TEM mode imaging on the JEOL NEOARM aberration-corrected TEM
TMI: XEDS/EELS Analysis on the JEOL NEOARM aberration corrected TEM
TMI: STEM mode imaging on the JEOL NEOARM aberration-corrected TEM