Equipment Type:

Electron Microscopy

Scanning Electron Microscopes (SEM)

Instrument Capabilities

The Hitachi S-5500 SEM is a high-resolution scanning electron microscope capable of achieving sub-nanometer resolution for detailed characterization of material surfaces and nanostructures. In addition to conventional SEM imaging, the instrument is equipped with scanning transmission electron microscopy (STEM) mode, enabling imaging of thin specimens in transmission.

The Duo-STEM bright-field (BF) and dark-field (DF) detector allows simultaneous acquisition and observation of BF and DF STEM images, providing complementary structural information. The instrument is also equipped with an energy-dispersive X-ray spectroscopy (EDS) system, which enables elemental identification and chemical composition analysis of materials at the nanometer scale.

The microscope is also equipped with an air-sensitive specimen holder, allowing samples that are sensitive to air or moisture to be transferred and examined while minimizing exposure to ambient conditions. This capability is particularly useful for air-sensitive, moisture-sensitive, and reactive materials.

Fees and Policies

• UT Users: $38/hour
• Higher Education/State Agencies: $63/hour
• Corporate/External Users: $63/hour

Traning

Users should register for the required in-person training course through UTLearn.