Rigaku Miniflex 600 Driffractometer I

Information the Equipment Can Provide

Coming soon

Fees and Policies

• UT Users: $7/hour
• Higher Education/State Agencies: $45/hour
• Corporate/External Users: $45/hour

To become a new user of this facility, please read the Instrument Reservation Information page. If you are already a user you can make a reservation in FBS.

To become a user of this instrument you must first complete the Cleanroom Safety Class. Please contact the facility manager to schedule a training session.

Leica EM TIC 3X

Instrument Capabilities

The Leica EM TIC 3X is a precision triple ion beam milling system designed for high-quality preparation of cross-sections and surfaces for electron microscopy.  It uses a broad, low-energy ion beam to remove material in a controlled manner, producing clean, deformation-free surfaces with minimal mechanical damage.

Key features:

• Triple ion-beam milling for high-quality cross-section and surface preparation.
• Wide-area cross-sectioning of samples greater than 4 × 1 mm.
• Large-area planar polishing over 25 mm diameter.
• Ion-beam energies from 1–10 keV (0.5 – 4.5 mA in 0.1 mA steps) for controlled material removal.
• High milling rates up to ~300 µm/hour, depending on material and conditions.
• Low-damage surface preparation with minimal mechanical deformation or smearing.
• Cryogenic cooling capability down to approximately −160 °C for temperature-sensitive materials.
• M80 Stereo microscope complete with 8:1  zoom and 0.8X achro objective
• VCT 500 docking station
• Equippend with stage for cross-sectioning
• TIC3X-VCT cryo sample holder  0 – 2 mm
• Cryo-saw insert used for cryo sample pre-preparation
• 25 L dewar with trolley
• Suitable for hard, soft, brittle, porous, multilayer, and heterogeneous materials.
• Enables preparation for SEM, EDS/WDS, EBSD, AFM, and other surface-analysis techniques.
• Particularly effective for battery materials, thin films, coatings, multilayers, interfaces, and failure analysis.

Fees and Policies

• UT Users: $20/hour
• Higher Education/State Agencies: $41/hour
• Corporate/External Users: $41/hour

Traning

Please contact This email address is being protected from spambots. You need JavaScript enabled to view it. to schedule a training session.

Leica Cryo Setup

Instrument Capabilities

The setup comprises the Leica EM VCM and EM VCT500 vacuum cryogenic sample-handling and transfer systems, coupled with a Leica cryo-stage. The configuration provides an integrated cryogenic workflow from sample handling and FIB-SEM preparation through TEM lamella preparation and transfer, enabling complementary three-dimensional imaging by FIB-SEM and high-resolution structural and analytical characterization by TEM.
The integrated system enables specimens to be maintained under controlled cryogenic, vacuum, or protected-atmosphere conditions during preparation and transfer between the FIB-SEM and TEM workflows. This controlled environment minimizes exposure to atmospheric contamination, moisture, and temperature fluctuations, thereby preserving the structural and chemical integrity of cryogenically prepared specimens.
Within the Scios DualBeam system, the cryogenic setup is used for specimen preparation, including the fabrication of cryogenic cross-sections and acquisition of three-dimensional FIB-SEM datasets. The system also supports the preparation of site-specific TEM lamellae under cryogenic conditions. Following preparation, the lamellae can be transferred using the EM VCT500 while maintaining cryogenic and controlled environmental conditions for subsequent analysis in the JEOL NEOARM TEM.
Leica EM VCM — Vacuum Cryo Manipulation System
The EM VCM functions as the cryogenic sample loading and manipulation workstation. Samples are introduced and manipulated on an LN₂-cooled working platform under vacuum, allowing the operator to mount specimens onto appropriate holders while minimizing exposure to atmospheric contaminants.

Key functions:

• Cryogenic sample loading and manipulation.
• Vacuum-controlled specimen handling from the loading stage onward.
• Liquid-nitrogen cooling and automated LN₂ replenishment.
• Illumination and magnification for accurate specimen manipulation.
• Accommodation of multiple specimen holders and transfer configurations.
• Connection to preparation and analysis systems such as the Scios dual Beam and the JEOL TEM.

Leica EM VCT500 — Vacuum Cryo Transfer System
The EM VCT500 is the transport component of the system. A specimen mounted on a compatible holder is transferred using the VCT500 shuttle between the VCM, and the electron microscopes.

The VCT500 provides:

• Vacuum cryogenic transfer between instruments.
• Active cooling of the specimen during transfer.
• Transfer under vacuum or a protected atmosphere.
• Temperature and vacuum monitoring when docked.
• The system also includes docking station for the Scios dual beam and a glovebox.

In addition, the system can also interface with the Leica cryo ion milling system (Leica EM TIC 3X).

Fees and Policies

• UT Users: $31/hour
• Higher Education/State Agencies: $54/hour
• Corporate/External Users: $46/hour

Traning

Please contact Dr. Raluca Gearba to schedule a training session.