Equipment Type:

Electron Microscopy

TEM Sample Preparation

Instrument Capabilities

The setup comprises the Leica EM VCM and EM VCT500 vacuum cryogenic sample-handling and transfer systems, coupled with a Leica cryo-stage. The configuration provides an integrated cryogenic workflow from sample handling and FIB-SEM preparation through TEM lamella preparation and transfer, enabling complementary three-dimensional imaging by FIB-SEM and high-resolution structural and analytical characterization by TEM.
The integrated system enables specimens to be maintained under controlled cryogenic, vacuum, or protected-atmosphere conditions during preparation and transfer between the FIB-SEM and TEM workflows. This controlled environment minimizes exposure to atmospheric contamination, moisture, and temperature fluctuations, thereby preserving the structural and chemical integrity of cryogenically prepared specimens.
Within the Scios DualBeam system, the cryogenic setup is used for specimen preparation, including the fabrication of cryogenic cross-sections and acquisition of three-dimensional FIB-SEM datasets. The system also supports the preparation of site-specific TEM lamellae under cryogenic conditions. Following preparation, the lamellae can be transferred using the EM VCT500 while maintaining cryogenic and controlled environmental conditions for subsequent analysis in the JEOL NEOARM TEM.
Leica EM VCM — Vacuum Cryo Manipulation System
The EM VCM functions as the cryogenic sample loading and manipulation workstation. Samples are introduced and manipulated on an LN₂-cooled working platform under vacuum, allowing the operator to mount specimens onto appropriate holders while minimizing exposure to atmospheric contaminants.

Key functions:

• Cryogenic sample loading and manipulation.
• Vacuum-controlled specimen handling from the loading stage onward.
• Liquid-nitrogen cooling and automated LN₂ replenishment.
• Illumination and magnification for accurate specimen manipulation.
• Accommodation of multiple specimen holders and transfer configurations.
• Connection to preparation and analysis systems such as the Scios dual Beam and the JEOL TEM.

Leica EM VCT500 — Vacuum Cryo Transfer System
The EM VCT500 is the transport component of the system. A specimen mounted on a compatible holder is transferred using the VCT500 shuttle between the VCM, and the electron microscopes.

The VCT500 provides:

• Vacuum cryogenic transfer between instruments.
• Active cooling of the specimen during transfer.
• Transfer under vacuum or a protected atmosphere.
• Temperature and vacuum monitoring when docked.
• The system also includes docking station for the Scios dual beam and a glovebox.

In addition, the system can also interface with the Leica cryo ion milling system (Leica EM TIC 3X).

Fees and Policies

• UT Users: $31/hour
• Higher Education/State Agencies: $54/hour
• Corporate/External Users: $46/hour

Traning

Please contact Dr. Raluca Gearba to schedule a training session.