Equipment: FEI TECNAI G2 F20 X-TWIN

Description

FEI TECNAI G2 F20 X-TWIN Transmission Electron Microscope (TEM) is an analytical system with excellent high-resolution imaging and atomic resolution microanalysis capabilities. The system is optimized for high spatial resolution analysis and has an EDS solid angle of 0.3 steradian.

• Unique, optimized user interface
• Excellent fine-probe performance
• Applications software support
• Advanced Electron Optics design
• Rapid mode switching
• Rapid acceleration voltage switching

Location

MER 1.824

Contact

Dr. Xiaoxia Gao

(512) 471-0233